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smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.8.9-arch1-1] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: SAMSUNG MZAL4512HBLU-00BL2 Serial Number: S67MNE0T628910 Firmware Version: 7L1QHXC7 PCI Vendor/Subsystem ID: 0x144d IEEE OUI Identifier: 0x002538 Controller ID: 7 NVMe Version: 1.4 Number of Namespaces: 1 Namespace 1 Size/Capacity: 512,110,190,592 [512 GB] Namespace 1 Utilization: 511,946,346,496 [511 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 002538 e62102c1c0 Local Time is: Tue May 7 22:02:13 2024 BST Firmware Updates (0x16): 3 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x005e): Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp Log Page Attributes (0x0f): S/H_per_NS Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg Maximum Data Transfer Size: 32 Pages Warning Comp. Temp. Threshold: 76 Celsius Critical Comp. Temp. Threshold: 85 Celsius Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 7.00W - - 0 0 0 0 0 0 1 + 7.00W - - 1 1 1 1 0 0 2 + 7.00W - - 2 2 2 2 0 0 3 - 0.0600W - - 3 3 3 3 200 2800 4 - 0.0050W - - 4 4 4 4 4000 19000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 - 512 0 0 1 - 4096 0 0 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 30 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 8% Data Units Read: 34,095,622 [17.4 TB] Data Units Written: 57,202,679 [29.2 TB] Host Read Commands: 279,502,453 Host Write Commands: 425,575,235 Controller Busy Time: 1,727 Power Cycles: 1,695 Power On Hours: 5,102 Unsafe Shutdowns: 74 Media and Data Integrity Errors: 0 Error Information Log Entries: 0 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Temperature Sensor 1: 30 Celsius Error Information (NVMe Log 0x01, 16 of 64 entries) No Errors Logged Self-test Log (NVMe Log 0x06) Self-test status: No self-test in progress No Self-tests Logged
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